JPH0637315Y2 - 回折測定用荷電試料台 - Google Patents
回折測定用荷電試料台Info
- Publication number
- JPH0637315Y2 JPH0637315Y2 JP1984184562U JP18456284U JPH0637315Y2 JP H0637315 Y2 JPH0637315 Y2 JP H0637315Y2 JP 1984184562 U JP1984184562 U JP 1984184562U JP 18456284 U JP18456284 U JP 18456284U JP H0637315 Y2 JPH0637315 Y2 JP H0637315Y2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- diffraction measurement
- base member
- electric field
- fixed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1984184562U JPH0637315Y2 (ja) | 1984-12-04 | 1984-12-04 | 回折測定用荷電試料台 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1984184562U JPH0637315Y2 (ja) | 1984-12-04 | 1984-12-04 | 回折測定用荷電試料台 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6199045U JPS6199045U (en]) | 1986-06-25 |
JPH0637315Y2 true JPH0637315Y2 (ja) | 1994-09-28 |
Family
ID=30742048
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1984184562U Expired - Lifetime JPH0637315Y2 (ja) | 1984-12-04 | 1984-12-04 | 回折測定用荷電試料台 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0637315Y2 (en]) |
-
1984
- 1984-12-04 JP JP1984184562U patent/JPH0637315Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPS6199045U (en]) | 1986-06-25 |
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